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Microcomputer Control Programmable Thermal Shock Chamber

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Dongguan Zhongli Instrument Technology Co., Ltd.
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City:dongguan
Province/State:guangdong
Contact Person:MsFiona Zhong
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Microcomputer Control Programmable Thermal Shock Chamber

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Brand Name :ZL
Model Number :ZL-6012
Certification :CE,ISO
Place of Origin :China
MOQ :1 set
Price :Negotiable
Payment Terms :L/C, T/T, Western Union
Supply Ability :60 Sets
Delivery Time :5-8 work days
Packaging Details :Programmable Thermal Cycling Test Hot and Cold Thermal Shock Chamber is packaged within wooden case.
Product name :Programmable Thermal Cycling Test Hot and Cold Thermal Shock Chamber
Expansion :Heat reach 300℃,cold reach -100 degree
Anti-sweat structure :insulation layer and door micro-thermal anti-sweat
Insulation material :High-density glass wool and high strength PU foam insulation
Outside material :stainless steel
Inside material :SUS#304 Cold-Heat-resistant stainless steel
Testing basket size :30cm(W)*40cm(H)*30cm(D)
Outside size :140cm(W)*180cm(H)*142cm(D)
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View Product Description
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Microcomputer Control Programmable Thermal Shock Chamber
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Product Overview
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Programmable Thermal Cycling Test Hot and Cold Thermal Shock Chamber designed for testing material changes under extreme temperature environments that alternate continuously in the shortest time. This equipment tests chemical changes or physical damage caused by thermal expansion and contraction.

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The testing chamber is divided into two parts: high-temperature region and low-temperature region. Testing samples are placed on a moving basket that moves up and down between hot and cold regions using unique heat storage and cool storage technology to complete thermal shock testing.

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Applied to test various materials including metal, plastic, rubber, electronics, and other materials. Results can be used as a basis for product improvement.

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View Environmental Test Chamber Details

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Download Technical Specifications (PDF)

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Primary Applications
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For electrical and electronic components, automation components, communication components, auto parts, metals, chemical materials, plastics industries, defense, aerospace, industrial industry, BGA, PCB base plates, electronic chips, ICs, semiconductor ceramics, and high-molecular materials.

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Tests material response to high and low temperature tension and repeated thermal expansion/contraction cycles. Confirms product quality from precision IC components to heavy machinery applications.

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Key Features
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  • Large color LCD touch interactive microcomputer control system, easy to understand operation
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  • Closed imported compressor + environmental refrigerant, cold plate heat exchanger and dual-type ultra-low temperature refrigeration systems
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  • LAN network communication interfaces for computer remote control
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  • Independent setting for heat, cold, and hot/cold conditions with three different function impacts
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  • Automatic pre-cooling, preheating, and standby functions during operation
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  • Configurable defrost cycles with automatic (manual) defrost capability
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  • User-friendly controller interface with comprehensive troubleshooting display
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Compliance Standards
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  • GB/T2423.1-1989 low-temperature testing method
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  • GB/T2423.2-1989 high-temperature testing method
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  • GB/T2423.22-1989 change temperature test
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  • GJB150.5-86 temperature impact test
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  • GJB360.7-87 temperature impact test
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  • GJB367.2-87 405 temperature impact test
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  • GB/T2423.1-2008 test A, GB/T2423.2-2008 test B
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  • GB-T10592-2008, GJB150.3-198, GJB360A-96 method 107 temperature shock test requirements
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Technical Specifications
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ModelZL-6012A
Temperature RangeA. High-temperature: +60\u2103\uff5e+150\u2103 (customizable)
B. Low-temperature: -10\u2103\uff5e-40\u2103
Control Temperature\u00b12\u2103
Resolution0.01\u2103
Heating Time (High-temperature)RT\uff5e\uff0b150\u2103 approximately 35min (RT from \uff0b5\uff5e\uff0b30\u2103)
Cooling Time (Low-temperature)RT\uff5e-40\u2103 approximately 50min (RT from \uff0b5\uff5e\uff0b30\u2103)
Moving & Recovery TimeA. Basket movement (high to low): 10 seconds
B. Temperature recovery: 3-5 minutes (Stabilization \u2265 30 minutes)
Device NoiseBelow 75dB
Weight10Kg
Testing Region50cm(W) \u00d7 50cm(H) \u00d7 50cm(D)
Outside Dimensions140cm(W) \u00d7 180cm(H) \u00d7 142cm(D)
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